Annual World Congress of Nano Science and Technology 2019 - Semi-analytical method for simultaneous extraction of subwavelength thin-film complex refractive index and thickness based on photometric measurement

Opublikowano: 07.01.2020 11:51

Semi-analytical method for simultaneous extraction of subwavelength thin-film complex refractive index and thickness based on photometric measurement

Marcin Kieliszczyk , Bartosz Janaszek , Paweł Szczepański

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Annual World Congress of Nano Science and Technology 2019 - Semi-analytical method for simultaneous extraction of subwavelength thin-film complex re...
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